A technique developed several years ago at NIST for improving optical microscopes now has been applied to monitoring the next generation of computer chip circuit components, potentially providing the semiconductor industry with a crucial tool for improving chips for the next decade or more.
Fuente : http://www.eurekalert.org/pub_releases/2013-06/nio...
Fuente : http://www.eurekalert.org/pub_releases/2013-06/nio...